Single-Event-Upset Sensitivity Analysis on Low-Swing Drivers
نویسندگان
چکیده
منابع مشابه
Single-Event-Upset Sensitivity Analysis on Low-Swing Drivers
Technology scaling relies on reduced nodal capacitances and lower voltages in order to improve performance and power consumption, resulting in significant increase in layout density, thus making these submicron technologies more susceptible to soft errors. Previous analysis indicates a significant improvement in SEU tolerance of the driver when the bias current is injected into the circuit but ...
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ژورنال
عنوان ژورنال: The Scientific World Journal
سال: 2014
ISSN: 2356-6140,1537-744X
DOI: 10.1155/2014/876435